Measuring residual stresses Syn2Y method
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The most important non-destructive method is the X-ray measurement method. This group also includes the sin2y method presented in the context of this experiment. Voltages of the first kind lead to an elastic distortion of the unit cell. Explains the recording technique in X-ray voltage measurement. While in diffraction recording in the usual beam geometry only lattice planes come to the reflection, which are parallel to the sample surface, one achieves by tilting the sample by the angle y, that in the voltage measurement also reflect such lattice planes, which are not oriented parallel to the surface.
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